Ingegneria Elettronica | ELECTRONICS LABORATORY

cod. 0612400027

ELECTRONICS LABORATORY

	0612400027
	DIPARTIMENTO DI INGEGNERIA INDUSTRIALE
	EQF6
	ELECTRONIC ENGINEERING
	2016/2017

PERCORSO COMUNE

	YEAR OF COURSE
	YEAR OF DIDACTIC SYSTEM 2016
	PRIMO SEMESTRE

TEACHING UNITS

	SSD	CFU	HOURS	ACTIVITY	TYPE OF ACTIVITY
	ING-INF/01	6	60	LESSONS	OPTIONAL SUBJECTS

PROFESSORS

HEINRICH CHRISTOPH NEITZERT T Curriculum

	Objectives
	IN THIS MODULE THE KNOWLEDGE OF THE STUDENTS REGARDING THE BASICS OF ELECTRONIC DEVICES AND CIRCUITS ARE APPLIED FOR THE DEVELOPMENT OF SPECIFIC APPLICATIONS, THAT WILL BE PROJECTED, REALIZED AND DESCRIBED IN DETAIL IN A TECHNICAL DOCUMENT.

	Prerequisites
	KNOWLEDGE OF THE FUNDAMENTALS OF ELECTRONIC DEVICES AND ELECTRICAL NETWORK THEORY ARE REQUIRED FOR A SUCCESSFUL PARTICIPATION.

	Contents
	CHARACTERIZATION OF THE STATIC AND DYNAMIC PROPERTIES OF SEMICONDUCTOR DEVICES: MEASUREMENT AND PARAMETER EXTRACTION OF THE STATIC PROPERTIES OF THE FOLLOWING ELECTRONIC DEVICES: PN-DIODE, SCHOTTKY-DIODE, BJT, JFET AND MOSFET. CHARACTERIZATION OF THE TEMPERATURE DEPENDENT ELECTRICAL CHARACTERISTICS. MEASUREMENT OF THE SWITCHING TIMES OF DIODES. APPLICATION OF DIODES AS TEMPERATURE AND OPTICAL SENSORS. CHARACTERIZATION OF PHOTODIODES, SOLAR CELLS AND LIGHT EMITTING DIODES (LED). CHARACTERIZATION OF THE FUNCTIONALITY AND TRANSFER CHARACTERISTICS OF LOGIC GATES, BASED ON DIFFERENT INTEGRATED TECHNOLOGIES. CHARACTERIZATION OF THE DYNAMIC PROPERTIES OF LOGIC GATES USING A RING-OSCILLATOR. WRITING OF OBJECT ORIENTED TEST SOFTWARE FOR THE ELECTRICAL CHARACTERIZATION OF ELECTRONIC DEVICES AND CIRCUITS.

CHARACTERIZATION OF THE STATIC AND DYNAMIC PROPERTIES OF SEMICONDUCTOR DEVICES: MEASUREMENT AND PARAMETER EXTRACTION OF THE STATIC PROPERTIES OF THE FOLLOWING ELECTRONIC DEVICES: PN-DIODE, SCHOTTKY-DIODE, BJT, JFET AND MOSFET. CHARACTERIZATION OF THE TEMPERATURE DEPENDENT ELECTRICAL CHARACTERISTICS. MEASUREMENT OF THE SWITCHING TIMES OF DIODES.
APPLICATION OF DIODES AS TEMPERATURE AND OPTICAL SENSORS. CHARACTERIZATION OF PHOTODIODES, SOLAR CELLS AND LIGHT EMITTING DIODES (LED).
CHARACTERIZATION OF THE FUNCTIONALITY AND TRANSFER CHARACTERISTICS OF LOGIC GATES, BASED ON DIFFERENT INTEGRATED TECHNOLOGIES. CHARACTERIZATION OF THE DYNAMIC PROPERTIES OF LOGIC GATES USING A RING-OSCILLATOR.
WRITING OF OBJECT ORIENTED TEST SOFTWARE FOR THE ELECTRICAL CHARACTERIZATION OF ELECTRONIC DEVICES AND CIRCUITS.

	Teaching Methods
	THE COURSE CONSISTS OF EXERCISES AND LABORATORY ACTIVITIES. THE STUDENTS, DIVIDED IN SMALL GROUPS , CHARACTERIZE ELECTRONIC COMPONENTS AND REALIZE BASIC ELECTRONIC CIRCUITS.

	Verification of learning
	THE FINAL ORAL EXAMINATION CONSISTS IN THE DISCUSSION OF THE MEASUREMENT PROTOCOLS AND TECHNICAL DOCUMENTATION, PRODUCED DURING THE FIRST MODULE OF COURSE (6CFU).