Ingegneria Elettronica | ELECTRONICS LABORATORY

cod. 0612400027

ELECTRONICS LABORATORY

	0612400027
	DIPARTIMENTO DI INGEGNERIA INDUSTRIALE
	EQF6
	ELECTRONIC ENGINEERING
	2022/2023

PERCORSO IN COMMON

	YEAR OF COURSE 3
	YEAR OF DIDACTIC SYSTEM 2018
	AUTUMN SEMESTER

TEACHING UNITS

	SSD	CFU	HOURS	ACTIVITY	TYPE OF ACTIVITY
	ING-INF/01	6	60	LESSONS	OPTIONAL SUBJECTS

PROFESSORS

HEINRICH CHRISTOPH NEITZERT T Curriculum

EXAMS

Exam	Date	Session
LABORATORIO DI ELETTRONICA	26/06/2023 - 09:00	SESSIONE ORDINARIA
LABORATORIO DI ELETTRONICA	17/07/2023 - 09:00	SESSIONE ORDINARIA
LABORATORIO DI ELETTRONICA	08/09/2023 - 09:00	SESSIONE DI RECUPERO

	Objectives
	- Knowing the fundamental electronic devices and the methods for the characterization of their statical and dynamical properties. - Know how to apply the knowledge regarding fundamental electronic devices and circuits for the realization and the test of simple electronic circuits for specific applications. - Being able to understand the datasheeets of electronic components. - Being able to determine the basic parameters of electronic devices by electrical testing and generate with these data a datasheet. - Know how to choose appropriate electronic devices for the development and the realization of basic electronic circuits. - Know how to realize in teamwork a complete measurement setup for the characterization of electronic devices and critically discuss the obtained measurement results. - Communication skills: Being able to describe, in written and oral form, correctly and clearly the acquired knowledge, and to produce documents, describing the laboratory experiences. - Learning skills: The student will be able to deepen the topics presented in the course by using multiple sources and materials.

- Knowing the fundamental electronic devices and the methods for the characterization of their statical and dynamical properties.

- Know how to apply the knowledge regarding fundamental electronic devices and circuits for the realization and the test of simple electronic circuits for specific applications.

- Being able to understand the datasheeets of electronic components.

- Being able to determine the basic parameters of electronic devices by electrical testing and generate with these data a datasheet.

- Know how to choose appropriate electronic devices for the development and the realization of basic electronic circuits.

- Know how to realize in teamwork a complete measurement setup for the characterization of electronic devices and critically discuss the obtained measurement results.

- Communication skills:
Being able to describe, in written and oral form, correctly and clearly the acquired knowledge, and to produce documents, describing the laboratory experiences.

- Learning skills:
The student will be able to deepen the topics presented in the course by using multiple sources and materials.

	Prerequisites
	KNOWLEDGE OF THE BASICS OF ELECTRICAL AND ELECTRONICAL ENGINEERING

	Contents
	- CHARACTERIZATION OF THE STATICAL AND DYNAMICAL PROPERTIES OF THE FONDAMENTAL ELECTRONIC DEVICES: MEASUREMENT AND PARAMETER DETERMINATION OF THE FOLLOWING DEVICES: PN- AND SCHOTTKY-DIODES, BJT, JFET AND MOSFET. (theory: 4h, exe: 2h, lab: 8h) - TEMPERATURE INFLUENCE ON THE ELECTRICAL CHARACTERISTICS OF SEMICONDUCTOR DIODES. (theory: 1h, lab: 2h) - MEASUREMENT OF THE SWITCHING CHARACTERISTICS OF PN- AND SCHOTTKY- DIODES. (theory: 1h, lab: 2h) - DEVELOPMENT OF APPLICATIONS FOR SENSING AND OPTOELECTRONICS OF DIODES: TEMPERATURE SENSORS; PHOTOSENSORS; SOLAR CELLS AND LIGHT EMITTING DIODES. (theory: 1h, lab: 4h) - CHARACTERIZATION OF THE LOGIC FUNCTIONALITY AND OF THE ELECTRICAL TRANSFER-FUNCTION OF DIGITAL LOGIC GATES, BASED ON DIFFERENT TECHNOLOGIES. (theory: 3h, exe: 1h, lab: 6h) - REALIZATION OF A RING-OSCILLATOR FOR THE DYNAMIC CHARACTERIZATION OF DIGITAL LOGIC GATES. (theory: 2h, lab: 4h) - DEVELOPMENT, REALIZATION AND CHARACTERIZATION OF BASIC ANALOG AND DIGITAL ELECTRONIC CIRCUITS. (theory: 2h, exe: 2h, lab: 11h) - WRTITING OF TEST SOFTWARE USING AN OBJECT ORIENTED LANGUAGE. (theory: 1h, lab: 3h)

Contents

- CHARACTERIZATION OF THE STATICAL AND DYNAMICAL PROPERTIES OF THE FONDAMENTAL ELECTRONIC DEVICES: MEASUREMENT AND PARAMETER DETERMINATION OF THE FOLLOWING DEVICES: PN- AND SCHOTTKY-DIODES, BJT, JFET AND MOSFET. (theory: 4h, exe: 2h, lab: 8h)

- TEMPERATURE INFLUENCE ON THE ELECTRICAL CHARACTERISTICS OF SEMICONDUCTOR DIODES. (theory: 1h, lab: 2h)

- MEASUREMENT OF THE SWITCHING CHARACTERISTICS OF PN- AND SCHOTTKY- DIODES. (theory: 1h, lab: 2h)

- DEVELOPMENT OF APPLICATIONS FOR SENSING AND OPTOELECTRONICS OF DIODES: TEMPERATURE SENSORS; PHOTOSENSORS; SOLAR CELLS AND LIGHT EMITTING DIODES. (theory: 1h, lab: 4h)

- CHARACTERIZATION OF THE LOGIC FUNCTIONALITY AND OF THE ELECTRICAL TRANSFER-FUNCTION OF DIGITAL LOGIC GATES, BASED ON DIFFERENT TECHNOLOGIES. (theory: 3h, exe: 1h, lab: 6h)

- REALIZATION OF A RING-OSCILLATOR FOR THE DYNAMIC CHARACTERIZATION OF DIGITAL LOGIC GATES. (theory: 2h, lab: 4h)

- DEVELOPMENT, REALIZATION AND CHARACTERIZATION OF BASIC ANALOG AND DIGITAL ELECTRONIC CIRCUITS. (theory: 2h, exe: 2h, lab: 11h)

- WRTITING OF TEST SOFTWARE USING AN OBJECT ORIENTED LANGUAGE. (theory: 1h, lab: 3h)

	Teaching Methods
	The course consists of theoretical lessons and laboratory exercises, that are finalized on the projecting, realization and testing of electronic circuits for the characterization of electronic devices (in small groups of students).

	Verification of learning
	THE ACHIEVEMENT OF THE OBJECTIVES OF THE TEACHING IS CERTIFIED BY PASSING THE EVALUATION EXAM (VOTE EXPRESSED ON A MINIMUM POINT OF 18 AND MAXIMUM POINT OF 30 CUM LAUDE). THE EXAMINATION CONSISTS OF AN ORAL TEST AT THE END OF THE COURSE AND CONSISTS IN THE DISCUSSION OF THE PROTOCOLS, REGARDING THE LABORATORY EXERCISES. THE ORAL EXAMINATION IS DONE IN ITALIAN OR, ON REQUEST OF THE STUDENT, IN ENGLISH. THE GRADES ARE BASED ON THE QUALITY OF THE PRESENTED PROTOCOL, ON THE STUDENT’S KNOWLEDGE OF THE COURSES CONTENT AND ON THE QUALITY OF THE PROTOCOL PRESENTATION OF THE STUDENT.

Verification of learning

THE ACHIEVEMENT OF THE OBJECTIVES OF THE TEACHING IS CERTIFIED BY PASSING THE EVALUATION EXAM (VOTE EXPRESSED ON A MINIMUM POINT OF 18 AND MAXIMUM POINT OF 30 CUM LAUDE). THE EXAMINATION CONSISTS OF AN ORAL TEST AT THE END OF THE COURSE AND CONSISTS IN THE DISCUSSION OF THE PROTOCOLS, REGARDING THE LABORATORY EXERCISES. THE ORAL EXAMINATION IS DONE IN ITALIAN OR, ON REQUEST OF THE STUDENT, IN ENGLISH. THE GRADES ARE BASED ON THE QUALITY OF THE PRESENTED PROTOCOL, ON THE STUDENT’S KNOWLEDGE OF THE COURSES CONTENT AND ON THE QUALITY OF THE PROTOCOL PRESENTATION OF THE STUDENT.

	Texts
	- RICHARD C. JAEGER AND TRAVIS N. BLALOCK, MICROELETTRONICA, McGRAW HILL , EDITION 2009. - DATASHEETS DISTRIBUTED BY THE TEACHER Further reading: - JOACHIM N. BURGHARTZ, STATE-OF-THE-ART ELECTRON DEVICES, WILEY AND IEEE PRESS, 2013.

	More Information
	THE COURSE LANGUAGE IS ITALIAN.

Lessons Timetable

BETA VERSION Data source ESSE3 [Ultima Sincronizzazione: 2023-05-23]

Ingegneria Elettronica | ELECTRONICS LABORATORY