Fisica | LABORATORY OF PHYSICS OF MATTER

cod. 0512600027

LABORATORY OF PHYSICS OF MATTER

	0512600027
	DIPARTIMENTO DI FISICA "E.R. CAIANIELLO"
	EQF6
	PHYSICS
	2018/2019

PERCORSO COMUNE Cohort 2016/2017

	YEAR OF COURSE 3
	YEAR OF DIDACTIC SYSTEM 2016
	SECONDO SEMESTRE

TEACHING UNITS

SSD	CFU	HOURS	ACTIVITY	TYPE OF ACTIVITY
FIS/01	4	32	LESSONS	SUPPLEMENTARY COMPULSORY SUBJECTS
FIS/01	2	24	LAB	SUPPLEMENTARY COMPULSORY SUBJECTS

	Objectives
	KNOWLEDGE AND UNDERSTANDING ABILITY THE COURSE PROVIDES KNOWLEDGE ABOUT SOME EXPERIMENTAL TECHNIQUES IN THE FRAMEWORK OF THE SOLID STATE PHYSICS , INCLUDING THE X-RAY DIFFRACTION, THE MEASUREMENT OF THE RESISTIVITY OF A METAL AS A FUNCTION OF THE TEMPERATURE, ALSO IN THE PRESENCE OF AN EXTERNAL MAGNETIC FIELD, AND THIN FILM DEPOSITION TECHNIQUES. ABILITY TO APPLY KNOWLEDGE AND UNDERSTANDING PURPOSE OF THE COURSE IS TO OBTAIN THAT THE STUDENT DEVELOPS THE ABILITY TO USE ADVANCED INSTRUMENTS FOR THE MEASUREMENT AND THE DATA ACQUISITION, IN PARTICULAR AT LOW TEMPERATURES, AND TO CRITICALLY ANALYZE THE RESULTS OBTAINED IN VIEW OF THE SUCCESSIVE STUDIES AND FOR IMMEDIATE WORK IN ELECTRONIC DEVICE COMPANIES

KNOWLEDGE AND UNDERSTANDING ABILITY
THE COURSE PROVIDES KNOWLEDGE ABOUT SOME EXPERIMENTAL TECHNIQUES IN THE FRAMEWORK OF THE SOLID STATE PHYSICS , INCLUDING THE X-RAY DIFFRACTION, THE MEASUREMENT OF THE RESISTIVITY OF A METAL AS A FUNCTION OF THE TEMPERATURE, ALSO IN THE PRESENCE OF AN EXTERNAL MAGNETIC FIELD, AND THIN FILM DEPOSITION TECHNIQUES.
ABILITY TO APPLY KNOWLEDGE AND UNDERSTANDING
PURPOSE OF THE COURSE IS TO OBTAIN THAT THE STUDENT DEVELOPS THE ABILITY TO USE ADVANCED INSTRUMENTS FOR THE MEASUREMENT AND THE DATA ACQUISITION, IN PARTICULAR AT LOW TEMPERATURES, AND TO CRITICALLY ANALYZE THE RESULTS OBTAINED IN VIEW OF THE SUCCESSIVE STUDIES AND FOR IMMEDIATE WORK IN ELECTRONIC DEVICE COMPANIES

	Prerequisites
	PHYSICS OF CONDENSED MATTER, AND CLASSICAL PHYSICS

	Contents
	- X-RAY DIFFRACTION: CRYSTALLINE STRUCTURES AND THE LATTICE PARAMETERS MEASUREMENT.LEZIONI FRONTALI 2 ORE LABORATORIO 8 - ELECTRIC TRANSPORT MEASURES MEASUREMENT OF ELECTRICAL RESISTIVITY AS A FUNCTION OF TEMPERATURE: SEMICONDUCTOR AND SUPERCONDUCTING METALS; MEASUREMENT METHODS: FOUR-WAY METHOD, VAN DER PAUW METHOD - SEEBECK EFFECT LEZIONI FRONTALI 4 ORE LABORATORIO 19 - HALL EFFECT AND MAGNETORESISTANCE: LONGITUDINAL AND TRANSVERSE RESISTANCE AS A FUNCTION OF THE APPLIED MAGNETIC FIELD; MEASUREMENT TECHNIQUES: AT CONSTANT TEMPERATURE AND AT CONSTANT MAGNETIC FIELD LEZIONI FRONTALI 4 ORE LABORATORIO 19 - THIN FILMS: PVD DEPOSITION TECHNIQUES; OPTICAL PHOTOLITHOGRAPHY.LEZIONI FRONTALI 2 ORE LABORATORIO 8

Contents

- X-RAY DIFFRACTION: CRYSTALLINE STRUCTURES AND THE LATTICE PARAMETERS MEASUREMENT.LEZIONI FRONTALI 2 ORE LABORATORIO 8
- ELECTRIC TRANSPORT MEASURES
MEASUREMENT OF ELECTRICAL RESISTIVITY AS A FUNCTION OF TEMPERATURE: SEMICONDUCTOR AND SUPERCONDUCTING METALS; MEASUREMENT METHODS: FOUR-WAY METHOD, VAN DER PAUW METHOD
- SEEBECK EFFECT LEZIONI FRONTALI 4 ORE LABORATORIO 19
- HALL EFFECT AND MAGNETORESISTANCE: LONGITUDINAL AND TRANSVERSE RESISTANCE AS A FUNCTION OF THE APPLIED MAGNETIC FIELD; MEASUREMENT TECHNIQUES: AT CONSTANT TEMPERATURE AND AT CONSTANT MAGNETIC FIELD LEZIONI FRONTALI 4 ORE LABORATORIO 19
- THIN FILMS: PVD DEPOSITION TECHNIQUES; OPTICAL PHOTOLITHOGRAPHY.LEZIONI FRONTALI 2 ORE LABORATORIO 8