Analog and Power Systems Electronics

Ingegneria Elettronica Analog and Power Systems Electronics

0622400026
DIPARTIMENTO DI INGEGNERIA INDUSTRIALE
ELECTRONIC ENGINEERING
2014/2015

OBBLIGATORIO
YEAR OF COURSE 1
YEAR OF DIDACTIC SYSTEM 2012
PRIMO SEMESTRE
CFUHOURSACTIVITY
990LESSONS
Objectives
THE COURSE AIMS TO PROVIDE THE TOOLS FOR THE ANALYSIS AND THE DESIGN OF CIRCUITS USED FOR THE GENERATION AND PROCESSING OF ANALOG SIGNALS. WE STUDY THE ELECTRONIC FRONT-END TO RECEIVE RADIO SIGNALS, THE VARIOUS FILTERING TECHNIQUES, THE LOW-NOISE AMPLIFIERS AND POWER OUTPUT STAGE. THIS PART ENDS WITH THE LOOKS OF THE MAIN ELECTRONIC DEVICES THAT ARE USED IN POWER ELECTRONICS AND THEIR OPERATING CHARACTERISTICS. THE EXERCISES CONSIST IN CARRYING OUT NUMERICAL EXERCISES AND PRACTICAL LABORATORY WORK ON DIFFERENT PARTS OF THE PROGRAM, WHILE BUILDING ON THE USE OF SOFTWARE TOOLS FOR CIRCUIT ANALYSIS.

AT THE END OF COURSE, THE STUDENT MUST DEMONSTRATE TO HAVE REACHED THE FOLLOWING OBJECTIVES.

• KNOWLEDGE AND UNDERSTANDING.

THE STUDENT WILL BE ABLE TO UNDERSTAND THE OPERATION OF ELECTRONICS USED FOR GENERATING (MIXERS, OSCILLATORS, FREQUENCY DIVIDERS, MODULATORS), RECEIVING (LC FILTERS, SC FILTERS, PLLS, LOW NOISE AMPLIFIERS) AND TRANSMITTING (POWER AMPLIFIERS) RADIO FREQUENCY SIGNALS. HE WILL BE ABLE TO USE ADVANCED MATHEMATICAL METHODS FOR THE DESIGN OF SWITCHED-CAPACITOR FILTERS (SC), TO UNDERSTAND THE OPERATION OF THE MAIN POWER ELECTRONIC DEVICES, AS WELL AS INNOVATIVE, AND FRAME SUCH KNOWLEDGE IN A BROADER ENGINEERING CONTEXT.

• APPLYING KNOWLEDGE AND UNDERSTANDING.

THE STUDENT WILL BE ABLE TO IDENTIFY, SIZE AND SOLVE:
- THE ARCHITECTURE OF A RECEIVER CIRCUIT FOR RADIO LINKS;
-THE STABILITY AND NOISE CHARACTERISTICS OF ELECTRONIC CIRCUITS;
-CIRCUITS FOR MODULATION, DEMODULATION AND FILTERING OF SIGNALS;
- AMPLIFIER CIRCUITS AND POWER ELECTRONIC DEVICES.

• MAKING JUDGEMENTS.

WILL BE ABLE TO:
- IDENTIFY DEVICES, ARCHITECTURES AND METHODOLOGIES IN ORDER TO SYNTHESIZE HIGH COMPLEXITY ANALOG CIRCUITS;
- PREDICT THE EFFECT OF DIFFERENT TOPOLOGIES ON THE SYSTEM PERFORMANCE;
- IDENTIFY THE PERFORMANCE OF DEVICES USING DATASHEETS AND TECHNICAL DOCUMENTATION;
- IDENTIFY THE MOST APPROPRIATE METHODS FOR THE ANALYSIS AND SYNTHESIS OF CIRCUITS;
- TAKE INTO ACCOUNT THE SAFE OPERATION LIMITS OF DEVICES AS RECOMMENDED BY MANUFACTURER;
- ASSEMBLE COMPLEX INTEGRATED CIRCUITS AND CHARACTERIZE PERFORMANCE WITH ANALYTICAL AND EXPERIMENTAL METHODS.

• COMMUNICATION SKILLS.

THE TECHNICAL CONTENTS OF THE COURSE NECESSARILY REQUIRE THE USE OF A TECHNICAL LANGUAGE FOR WRITTEN AND ORAL EXPOSURE, WHOSE OCCURRENCE IS HIGHLY DISCRIMINATORY ELEMENT FOR PASSING THE TEST. FOR THE NEED TO ORGANIZE THE LABORATORY WORK BY GROPING THE STUDENTS, THE STUDENT WILL GAIN EXPERIENCE OF WORKING IN GROUPS AND COMMUNICATING WITH A SPECIFIC TECHNICAL LANGUAGE.

• LEARNING SKILLS.

FOR THE NEED, PURSUED BY THE COURSE, TO MAKE THE STUDENT CAPABLE TO ANALYZE THE EFFECTS OF INCREASING INTEGRATION LEVEL OF CIRCUITS ON PERFORMANCES, HE WILL HAVE AWARENESS OF THE CONTINUING EVOLUTION IN THE ELECTRONIC FIELD AND OF NEED FOR A CONTINUOUS INDEPENDENT LEARNING.

Prerequisites
TO SUCCESSFULLY ACHIEVE THE OBJECTIVES OF THE COURSE, THE STUDENT MUST HAVE KNOW:
- BASIC CONTENTS OF INTEGRATED ANALOG CIRCUITS;
- ANALOG AND DIGITAL MODULATION TECHNIQUES;
- LAPLACE TRANSFORM TECHNIQUE;
- METHODS USED FOR STABILITY ANALYSIS (ROOT LOCUS, NYQUIST)
Contents
- NOISE CHARACTERISTICS: NOISE SOURCES OF DEVICES, NOISE FIGUES OF CIRCUITS;

- RADIO FREQUENCY CIRCUITS: MIXER, LC OSCILLATORS, RING OSCILLATORS, ARBITRARY SIGNAL GENERATORS, RLC FILTERS, SWITCHED CAPACITOR FILTERS, PLL, VCO, COMPARATORS, A/D AND DA CONVERTERS, TIMERS, VCO, CHARGE PUMP, PROGRAMMABLE CIRCUITS, LNA;

- INTEGRATED POWER AMPLIFIERS: EFFICIENCY, DISTORTION AND OPERATION CLASSES, POWER AMPLIFIERS;

POWER DEVICES: FEATURES AND OPERATING LIMITS (HIGH FIELD AND THERMAL EFFECTS, SOA), DIODES, BJT, JFET, MOSFET AND IGBT;
Teaching Methods
THE TEACHING CONSISTS OF LECTURES, CLASS EXERCISES AND PRACTICAL LABORATORY WORK.
DURING TRAINING IN THE CLASSROOM, STUDENTS WILL BE ASKED TO PERFORM THE NUMERICAL EXERCISES ON VARIOUS TOPICS OF THE COURSE, WHILE THE LABORATORY ACTIVITIES, WHICH WILL BE CARRIED OUT BY GROPING THE STUDENTS IN ORDER TO STRENGTHEN THE ABILITY TO WORK IN TEAMS, WILL BE AIMED AT SIZING, ASSEMBLY AND CHARACTERIZATION OF CIRCUITS WITH ASSIGNED PERFORMANCE.
Verification of learning
The achievement of the objectives will be assessed through a written test and an oral interview, both aimed to judge the degree of knowledge of subjects, the ability to apply, the critical spirit shown by the student when dealing with the electronic circuits analysis and, finally, the clarity of exposure. To pass the written exam, the student must demonstrate to have understood the main concepts presented in the course and be able to apply the methods of analysis, by agreeing to quantitative solutions. The evaluation of the script, which will take into account both the accuracy of the analysis and the exhibition quality, will cover the categories "good, fair and sufficient", which allow the student to access the oral test, while the "wholly inadequate" category will prevent the admission, thus returning the “the written test” with the notations of deficiencies manifested. For a better graduation of judgment on written tests that are on the borderline of "sufficiency", the "insufficient" category can be used which grants a "conditional" admission. In this case, the maximum score achievable is limited to 20/30. The results of the written tests, with an indication of the admission category, will be published in the ESSE3 section of teaching, by including the time and the classroom for conducting the oral exam. On that occasion, the Commission can return to all students copy of the written paper, with marked errors and some solution suggestions.
The oral exam will assess a) the maturity on the arguments b) the quality of oral presentation c) the critical spirit with which the student deals with topics d) the judgment and) the accuracy of scientific language. The final vote, out of thirty, will account for the degree of achievement of the previous requirement and for possible restrictions resulting from written test. Praise would occur in the case of written test assessed at least decent and oral examination whic fully satisfies the previous criteria
Texts
- BEHZAD RAZAVI “RF MICROELECTRONICS” – 2° EDITION, PEARSON, 2011
- M. RASHID “POWER ELECTRONICS” PRENTICE HALL, 2003
- ADEL S. SEDRA AND KENNETH C. SMITH “MICROELECTRONICS CIRCUITS” OXFORD UNIVERSITY PRESS, 2004
- NOTES DISTRIBUTED BY THE TEACHER
- B. JAYANT BALIGA “FUNDAMENTAL OF POWER SEMICONDUCTOR DEVICES” SPRINGER, 2008.
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